Model: Uniscan SKPR1171

The scanning Kelvin probe is a non-contact, non-destructive instrument designed to measure the surface work function difference between conducting, coated, or semi-conducting materials and a metallic probe. The SKP at MERI has the ability to make measurements in a humid or gaseous environment and is capable of examining conducting and semi-conducting materials. The Kelvin probe measures the work function of a material, which in turn can be related to its corrosion potential, Ecorr

Applications of the SKP include

• Filiform corrosion studies
• Transport process of hydrated ions
• Study of fuel cell catalysts
• Characterisation of photovoltaic materials
• Femi-level mapping

The scanning Kelvin probe is part of our Uniscan M370 Scanning Electrochemical Workstation.