The Eifeler Image Analysis Suite is a comprehensive imaging system consisting of an Olympus BX40 high magnification optical microscope linked via a CCD camera to a dedicated PC. The powerful image analysis package ‘analySIS’ may be used both to manipulate images for digital storage and to calculate parameters such as coating thickness from a ball-crater image.

Calibrated optical microscopy for tool wear analysis and coating thickness measurement.

The Zeiss, Stemi SVII Binocular Optical Microscope has an adjustable light source and is used at low magnification for tool inspection.

The Xi Zeiss, Industrial Research Axio-Tech bright field/dark field microscope with interference contrast capability is particularly useful in distinguishing worn and pristine coating surfaces.

The Minolta CM508D Colourimeter is capable of measuring surface colour to all international standards with or without inclusion of the specular component.

For further information please contact us on 0114 225 3500 or MERI@shu.ac.uk.